Power
Flash Corruption: Software Bug or Supply Voltage Fault?
Flash memory is commonly used to store firmware in embedded systems. Occasionally, the firmware stored...
5G Evolution – On The Path To 6G
Pushing the limits of 5G 5G New Radio (5G NR) network rollouts are in full swing globally, with standardization...
Conformance Test Failed, What Now?
Conformance tests are performed on serial data interfaces such as USB, HDMI and PCI Express to ensure...
Loop Gain Digital Redesign
Two methods can be used to re-design loop-gain digitally for the power supply converters: digital redesign...
Common Power Problems & Power Protection Solutions
The importance of clean, reliable and continuous power is paramount for the technology we depend on in...
Safety Laser Scanners vs. Safety Mats – Which One Do I Choose?
Since the introduction of safety mats in the 1950s, a host of new technologies have emerged for safety...
Analyzing Automotive Radar Signals with an Oscilloscope
Driverless cars are virtually unique in symbolizing the power of future technologies and digitalization...
A NEW APPROACH TO PFC INRUSH PROTECTION
There are currently two common approaches to PFC inrush current protection. Such protection caters only...
Ball vs. Sleeve: A Comparison In Bearing Performance
As consumers demand smaller, faster computer systems, OEM design engineers race to create systems with...
Dual Stage Feedback Technique for Single - Pole Feedback Compensation
This paper processes and studies the effects of a dual - stage compensation technique for achieving greater...
BMI160 Small, low-power Inertial Measurement Unit
The BMI160 is a small, low-power, low-noise 16 bit Inertial Measurement Unit designed for use in mobile...
Sign up for Electronic Pro Tech Publish Hub
As a subscriber you will receive alerts and free access to our constantly updated library of white papers, analyst reports, case studies, web seminars and solution reports.