Resistors
Flash Corruption: Software Bug or Supply Voltage Fault?
Flash memory is commonly used to store firmware in embedded systems. Occasionally, the firmware stored...
Advanced Probing In DDR3/DDR4 Memory Designs
For reliable and efficient system verification and debug of DDR3/DDR4 memory designs, comprehensive compliance...
Verification Methods of Snubber Circuits in Flyback Converters
Beside the common advantages of a flyback converter, it has inherently parasitic components, which typically...
System Level Verification and Debug of DDR3/4 Memory Designs
This application note provides an introduction to the DDR memory technology and explains common challenges,...
Accurately measuring efficiency of ultralow-IQ devices
While almost every power-supply engineer intimately knows and understands the lab setup for measuring...
Gate Drive Measurement Considerations
One of the primary purposes of a gate driver is to enable power switches to turn on and off faster, improving...
Fundamentals of Building a Test System
Most organizations do not consider production test a top priority, but it is a necessity to prevent major...
Sources of Phase Noise and Jitter in Oscillators
The output signal of an oscillator, no matter how good it is, will contain all kinds of unwanted noises...
Measurement of inrush currents
All electronic devices contain capacitive or inductive components that can cause a disproportionately...
Reliability in Electronics
Most of us are familiar with the concepts of reliability and MTBF at a superficial level, without considering...
RS-485 Isolator Raises the Bar for Bus Node Designs
This white paper focuses on isolated digital interfaces conforming to RS-485, which continues to be the...
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