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Signal Model Based Approach to Joint Jitter and Noise Decomposition

Published by: Rohde & Schwarz

In this whitepaper, Rohde and Schwarz introduces a joint jitter and noise analysis framework for serial PAM transmission based on a parametric signal model. The approach has several benefits over other state-of-the-art methods.
The identification of jitter and noise sources is critical when debugging failure sources in the transmission of high-speed serial signals. With ever-increasing data rates accompanied by decreasing jitter budgets and noise margins, managing jitter and noise sources remains a critical consideration for engineers. Methods for decomposing jitter have matured considerably over the past 20 years,however, they are mostly based on time interval error (TIE) measurements alone. This TIE-centric view discards a significant portion of the information present in the input signal and thus limits the decomposition accuracy.
In this whitepaper from Rohde and Schwarz, discover example measurement results as well as comparisons with other methodologies.

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Lang: ENG
Type: Whitepaper Length: 24 pages

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